IE200M series metallurgical microscope
• Professional metallurgical objective and plan eyepiece provide clear image, high
resolution, comfortable observation
• Superior image and reliable mechanical structure.
• With the corresponding photo or video accessories, can collect and preserve
the image, with computers and specialized metallographic analysis software
can analysis the metallographic image.
• Easy to operate, Have all kinds of accessories. Widely used in teaching and
research metallographic analysis, semiconductor silicon wafer inspection,
geology mineral analysis, precision engineering and surveying fields.
Specifications
Optical system | Finity color corrected optical system |
Viewing head | Gemel trinocular,45°inclined,Diopter adjustment ±5 for each side,Interpupillary distance adjustable between:54-75mm,refract rate,binocular:trinocular =80%:20% |
Eyepiece | High eyepoint wide field plan eyepiece PL10X/18mm |
High eyepoint wide field eyepiece WF15X/13 | |
High eyepoint wide field eyepiece WF20X/10mm | |
Metallurgical objcetive | LWD plan achromatic metallurgical objective 5X,10X,20X,50X,100X |
Nosepiece | Reversed quadruple nosepiece |
Reversed quintuple nosepiece | |
Focusing adjustment | Low position coaxial coarse and fine adjustment. with tightness adjustment.Coarse adjustment range 38 mm;precision of fine adjustment:2um, |
stage | Three-ply mechanical stage,area 180mmX155mm,right hand low position control,Moving range:75mm×40mm; Metal stage plate,center hole dia.φ12mm |
Illumination system | Reflection Koehler illumination with iris diaphragm and centerable field diaphragm , wide-range voltage 90-240V ,6V/30W halogen bulb(single 3W LED option), with continuous intensity |
Polarizing kit | Polarizer and the analyzer can be removed from the optical path, the analyzer can be rotated 360 °. |
Photo accessories | Photo tube(with PK mount),photo eyepiece 3.2X |
Video accessories | CTV0.5X/1.0X |
software | specialized metallographic analysis software |