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IEC60529/IEC60065 Sphere test probe A
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IEC60529/IEC60065 Sphere test probe A

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IEC60529/IEC60065 Sphere test probe A

1.Application:

Test Sphere Probe is intended to verify protection of persons against access to hazardous parts for an IP1 Code.Also used to verify protection from access with the back of the hand for an IP suffix A code.

It is strictly designed and manufactured according to IEC61032 IEC60529 IEC60065 standards and other similar international standards.

2.Technical parameter:

Ball diameter50mm
Baffle plate diameter45mm
Baffle plate thickness4mm
Handle diameter10mm
Handle length100mm
Material

plastic(delrin) + stainless steel



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Shenzhen Chuangxin Instrument Co., Ltd
F8, Gongle Fenghe Guard, Xi Xiang Town, Bao'an District, Shenzhen, Guangdong, China (Mainland)
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