Portable EDXRF Spectrometer With Si-Pin Detector , High resolution

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Portable EDXRF Spectrometer With Si-Pin Detector , High resolution

 

 

 

Quick Detail:

 

The energy dispersive X-ray fluorescence analysis (XRF) is a method for analysing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample . In both laboratory and industrial environments, the XRF method is now well established and can be readily utilised with modern equipmen 

 

 

Competitive Advantage:

  • Non-destructive: The X-radiation has absolutely no lasting influence on the material; it fully retains its quality.
  • Fast: The XRF method needs very simple sample preparation and short measurement times range in the seconds, rarely longer than one minute.
  • Clean: No chemicals are used.
  • Safe: Method without the use of environmentally hazardous chemicals, X-radiation poses no risk for operator due to the protective instrument design.
  • Universally applicable: The XRF method is suitable for material analysis in a very broad range of applications.

 

 

Description:

 

EXF9500 can provide customers higher accuracy and precision.

EXF9500 delivers wide elemental coverage with an easy-to-learn software. Non-destructively analyze from sodium (Na) through uranium (U) in powders, liquids and solids.

It is designed exactly to security standards with active radiation protection, high voltage protection and X-ray tube overheating protection.

Low cost with unmatched performance-to-price ratio

 

 

Applications:

 

Fast, precise and non-destructive metal testing for jewellery retailers, jewellery manufacturers, precious metal refineries, pawn shops, government quality inspection departments, banks, laboratories and tertiary institutions.

 

 

Specifications:

 

Working Principle:

Energy Dispersive X-ray Fluorescence

Size(mm):

670*400*300

Detection limit:

100ppm Best substance effect

Precision:

±10ppm~0.1%

Expanded Uncertainty:

≤0.19%

Operating Environment:

Temperature -11~46

Humidity ≤70%

High Voltage:

0~50KV/0~1MA

Detector:

Si-Pin145Kev±5

Testable Elements:

Any 20 Elements from whole elements (Na~U)

Main Structure:

High-strength metal frame and industry plastic shell

N/G Weight(KG):

30 / 35

 

Gold Tester, XRF Spectrometer, XRF Analyzer, Precious Metals Tester

 


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Mr. Alex
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China Security Scanner Online Market
No. 545, Qianhu Road, Shenzhen, Guangdong, China (Mainland)
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