The 370A, the world standard for high resolution curve tracers is used in a wide variety of applications. The 370A performs DC parametric characterization of transistors, thyristors, diodes, SCRs, MOSFETs, optoelectronic components, solar cells, solid state displays and other semiconductor devices.
In the R&D lab, it is used for characterization of new designs, extraction of SPICE parameters, failure analysis and data sheet generation.
In manufacturing test, the 370A is used to verify device quality and process monitoring.
The 370A is used for incoming inspection to verify device performance, perform failure analysis and to match components.
